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/* Copyright (c) 2013 The Chromium OS Authors. All rights reserved.
* Use of this source code is governed by a BSD-style license that can be
* found in the LICENSE file.
*/
/* Peripheral stress tests */
#include "console.h"
#include "ec_commands.h"
#include "i2c.h"
#include "test_util.h"
#include "timer.h"
#include "util.h"
#ifdef CONFIG_ADC
#include "adc.h"
#endif
static int error_count;
/*****************************************************************************/
/* Test parameters */
/* I2C test */
#define I2C_TEST_ITERATION 2000
struct i2c_test_param_t {
int width; /* 8 or 16 bits */
int port;
int addr;
int offset;
int data; /* Non-negative represents data to write. -1 to read. */
} i2c_test_params[] = {
#ifdef BOARD_spring
{8, 0, 0x60, 0x0, -1},
{8, 0, 0x60, 0x0, 0x40},
{8, 0, 0x4a, 0x1, -1},
#elif defined(BOARD_daisy)
{8, 1, 0x90, 0x19, -1},
#elif defined(BOARD_link)
{8, 0, 0x16, 0x8, -1},
{8, 0, 0x16, 0x9, -1},
{8, 0, 0x16, 0xa, -1},
#elif defined(BOARD_pit)
{8, 0, 0x90, 0x19, -1},
#elif defined(BOARD_snow)
{8, 1, 0x90, 0x19, -1},
#endif
};
/* Disable I2C test for boards without test configuration */
#if defined(BOARD_bds) || defined(BOARD_mccroskey) || defined(BOARD_slippy) || \
defined(BOARD_falco) || defined(BOARD_peppy) || defined(BOARD_wolf)
#undef CONFIG_I2C
#endif
/* ADC test */
#define ADC_TEST_ITERATION 2000
/*****************************************************************************/
/* Test utilities */
/* Linear congruential pseudo random number generator*/
static uint32_t prng(void)
{
static uint32_t x = 1357;
x = 22695477 * x + 1;
return x;
}
/* period between 500us and 32ms */
#define RAND_US() (((prng() % 64) + 1) * 500)
static int stress(const char *name,
int (*test_routine)(void),
const int iteration)
{
int i;
for (i = 0; i < iteration; ++i) {
if (i % 10 == 0) {
ccprintf("\r%s...%d/%d", name, i, iteration);
usleep(RAND_US());
}
if (test_routine() != EC_SUCCESS)
return EC_ERROR_UNKNOWN;
}
ccprintf("\r%s...%d/%d\n", name, iteration, iteration);
return EC_SUCCESS;
}
#define RUN_STRESS_TEST(n, r, iter) \
do { \
if (stress(n, r, iter) != EC_SUCCESS) { \
ccputs("Fail\n"); \
error_count++; \
} \
} while (0)
/*****************************************************************************/
/* Tests */
#ifdef CONFIG_I2C
static int test_i2c(void)
{
int res = EC_ERROR_UNKNOWN;
int dummy_data;
struct i2c_test_param_t *param;
param = i2c_test_params + (prng() % (sizeof(i2c_test_params) /
sizeof(struct i2c_test_param_t)));
if (param->width == 8 && param->data == -1)
res = i2c_read8(param->port, param->addr,
param->offset, &dummy_data);
else if (param->width == 8 && param->data >= 0)
res = i2c_write8(param->port, param->addr,
param->offset, param->data);
else if (param->width == 16 && param->data == -1)
res = i2c_read16(param->port, param->addr,
param->offset, &dummy_data);
else if (param->width == 16 && param->data >= 0)
res = i2c_write16(param->port, param->addr,
param->offset, param->data);
return res;
}
#endif
#ifdef CONFIG_ADC
__attribute__((weak)) int adc_read_all_channels(int *data)
{
int i;
int rv = EC_SUCCESS;
for (i = 0 ; i < ADC_CH_COUNT; ++i) {
data[i] = adc_read_channel(i);
if (data[i] == ADC_READ_ERROR)
rv = EC_ERROR_UNKNOWN;
}
return rv;
}
static int test_adc(void)
{
int data[ADC_CH_COUNT];
return adc_read_all_channels(data);
}
#endif
void run_test(void)
{
test_reset();
#ifdef CONFIG_I2C
RUN_STRESS_TEST("I2C Stress Test", test_i2c, I2C_TEST_ITERATION);
#endif
#ifdef CONFIG_ADC
RUN_STRESS_TEST("ADC Stress Test", test_adc, ADC_TEST_ITERATION);
#endif
test_print_result();
}
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