Accelerate utest.

For some test cases which include more than one kernel, the current
implementation always build the program for a new sub test case.

That wastes a lot of time. This patch introduce a new macro
MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM which has an extra parameter
to specify whether to keep the previous program and avoid the extra
build. The normal usage is:

MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(fn1, true);
MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(fn2, true);
MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(fn3, true);
MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(fn4, true);
MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(fn5, false);

The scenario is that the above fn1-5 are included in the same kernel
file and we define the sub cases in the same cpp file. We already
have some examples of this usage in the compiler_abs.cpp, compiler_abs_diff.cpp
compiler_basic_arithmetic.cpp, compiler_vector_load_store.cpp, etc.

This patch reduces 2/3 of the utests execution time.

v2: should always destroy the program when run one specific test case.

Signed-off-by: Zhigang Gong <zhigang.gong@intel.com>
Reviewed-by: "Song, Ruiling" <ruiling.song@intel.com>

1 files changed, 22 insertions, 18 deletions

diff --git a/utests/compiler_basic_arithmetic.cpp b/utests/compiler_basic_arithmetic.cpp
index dcdd0849..0e5ec41a 100644
--- a/utests/compiler_basic_arithmetic.cpp
+++ b/utests/compiler_basic_arithmetic.cpp
@@ -61,52 +61,56 @@ std::cout <<"kernel name: " << kernel_name << std::endl;
   buf_data[0] = buf_data[1] = NULL;
 }
 
-#define DECL_TEST_SUB(type, alias) \
+#define DECL_TEST_SUB(type, alias, keep_program) \
 static void compiler_sub_ ##alias(void)\
 {\
   test_exec<type, TEST_OP_SUB>("compiler_sub_" # alias);\
 }\
-MAKE_UTEST_FROM_FUNCTION(compiler_sub_ ## alias)
+MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(compiler_sub_ ## alias, keep_program)
 
-#define DECL_TEST_ADD(type, alias) \
+#define DECL_TEST_ADD(type, alias, keep_program) \
 static void compiler_add_ ##alias(void)\
 {\
   test_exec<type, TEST_OP_ADD>("compiler_add_" # alias);\
 }\
-MAKE_UTEST_FROM_FUNCTION(compiler_add_ ## alias)
+MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(compiler_add_ ## alias, keep_program)
 
-#define DECL_TEST_MUL(type, alias) \
+#define DECL_TEST_MUL(type, alias, keep_program) \
 static void compiler_mul_ ##alias(void)\
 {\
   test_exec<type, TEST_OP_MUL>("compiler_mul_" # alias);\
 }\
-MAKE_UTEST_FROM_FUNCTION(compiler_mul_ ## alias)
+MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(compiler_mul_ ## alias, keep_program)
 
-#define DECL_TEST_DIV(type, alias) \
+#define DECL_TEST_DIV(type, alias, keep_program) \
 static void compiler_div_ ##alias(void)\
 {\
   test_exec<type, TEST_OP_DIV>("compiler_div_" # alias);\
 }\
-MAKE_UTEST_FROM_FUNCTION(compiler_div_ ## alias)
+MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(compiler_div_ ## alias, keep_program)
 
-#define DECL_TEST_REM(type, alias) \
+#define DECL_TEST_REM(type, alias, keep_program) \
 static void compiler_rem_ ##alias(void)\
 {\
   test_exec<type, TEST_OP_REM>("compiler_rem_" # alias);\
 }\
-MAKE_UTEST_FROM_FUNCTION(compiler_rem_ ## alias)
+MAKE_UTEST_FROM_FUNCTION_KEEP_PROGRAM(compiler_rem_ ## alias, keep_program)
 
-#define DECL_TEST_FOR_ALL_TYPE(op)\
-DECL_TEST_##op(int8_t, char) \
-DECL_TEST_##op(uint8_t, uchar) \
-DECL_TEST_##op(int16_t, short) \
-DECL_TEST_##op(uint16_t, ushort) \
-DECL_TEST_##op(int32_t, int) \
-DECL_TEST_##op(uint32_t, uint)
+#define _DECL_TEST_FOR_ALL_TYPE(op, keep_program) \
+DECL_TEST_##op(int8_t, char, true) \
+DECL_TEST_##op(uint8_t, uchar, true) \
+DECL_TEST_##op(int16_t, short, true) \
+DECL_TEST_##op(uint16_t, ushort, true) \
+DECL_TEST_##op(int32_t, int, true) \
+DECL_TEST_##op(uint32_t, uint, keep_program)
+
+#define DECL_TEST_FOR_ALL_TYPE(op) _DECL_TEST_FOR_ALL_TYPE(op, true)
+
+#define DECL_TEST_FOR_ALL_TYPE_END(op) _DECL_TEST_FOR_ALL_TYPE(op, false)
 
 DECL_TEST_FOR_ALL_TYPE(SUB)
 DECL_TEST_FOR_ALL_TYPE(ADD)
 DECL_TEST_FOR_ALL_TYPE(MUL)
 DECL_TEST_FOR_ALL_TYPE(DIV)
-DECL_TEST_FOR_ALL_TYPE(REM)
+DECL_TEST_FOR_ALL_TYPE_END(REM)
 #undef DECL_TEST_FOR_ALL_TYPE