summaryrefslogtreecommitdiff
path: root/gcc/testsuite/gcc.target/aarch64/sve_strided_load_4.c
blob: b7dc12fb3c7a267bc220a68ee5764dd60306cfea (plain)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
/* { dg-do assemble } */
/* { dg-options "-O2 -ftree-vectorize -march=armv8-a+sve --save-temps" } */

#include <stdint.h>

#define TEST_LOOP(DATA_TYPE, NAME, SCALE)			\
  void __attribute__ ((noinline, noclone))			\
  f_##DATA_TYPE##_##NAME (DATA_TYPE *restrict dest,		\
			   DATA_TYPE *restrict src, int n)	\
  {								\
    for (int i = 0; i < n; ++i)					\
      dest[i] += src[i * SCALE];				\
  }

#define TEST_TYPE(T, DATA_TYPE)			\
  T (DATA_TYPE, 5, 5)				\
  T (DATA_TYPE, 7, 7)				\
  T (DATA_TYPE, 11, 11)				\
  T (DATA_TYPE, 200, 200)			\
  T (DATA_TYPE, m100, -100)

#define TEST_ALL(T)				\
  TEST_TYPE (T, int32_t)			\
  TEST_TYPE (T, uint32_t)			\
  TEST_TYPE (T, float)				\
  TEST_TYPE (T, int64_t)			\
  TEST_TYPE (T, uint64_t)			\
  TEST_TYPE (T, double)

TEST_ALL (TEST_LOOP)

/* { dg-final { scan-assembler-times {\tld1w\tz[0-9]+\.s, p[0-7]/z, \[x[0-9]+, z[0-9]+.s, sxtw 2\]\n} 15 } } */
/* { dg-final { scan-assembler-times {\tld1d\tz[0-9]+\.d, p[0-7]/z, \[x[0-9]+, z[0-9]+.d, lsl 3\]\n} 15 } } */