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| author | Avi Levin <avi.levin@samsung.com> | 2015-01-12 13:34:01 +0200 |
|---|---|---|
| committer | Tom Hacohen <tom@stosb.com> | 2015-01-12 11:56:42 +0000 |
| commit | dad44a7100581ecc050271e9035c4f66dd2ed6ea (patch) | |
| tree | c6ca52aa452b28b32ad4b0ca32b7d3e4a441fb78 /NEWS | |
| parent | 82014cad2c11b40e455e0578d22f09b04ebd1e5c (diff) | |
| download | efl-dad44a7100581ecc050271e9035c4f66dd2ed6ea.tar.gz | |
Eo tests: Fix bad free in eo_test_value
When running eo_test_suite we get an memory error: "double free or corruption".
That error arises because we try to free an Eina_Value value in eo_test_value
that doesn't need to freed.
I switched the eina_value_free to wina_value_flush, the proper way of
releasing it.
@fix
Diffstat (limited to 'NEWS')
0 files changed, 0 insertions, 0 deletions