/* Copyright (c) 2013 The Chromium OS Authors. All rights reserved. * Use of this source code is governed by a BSD-style license that can be * found in the LICENSE file. */ /* Various utility for unit testing */ #ifndef __CROS_EC_TEST_UTIL_H #define __CROS_EC_TEST_UTIL_H #include "common.h" #include "console.h" #include "stack_trace.h" #define RUN_TEST(n) \ do { \ ccprintf("Running %s...", #n); \ cflush(); \ if (n() == EC_SUCCESS) { \ ccputs("OK\n"); \ } else { \ ccputs("Fail\n"); \ __test_error_count++; \ } \ } while (0) #define TEST_ASSERT(n) \ do { \ if (!(n)) { \ ccprintf("%d: ASSERTION failed: %s\n", __LINE__, #n); \ task_dump_trace(); \ return EC_ERROR_UNKNOWN; \ } \ } while (0) #define __ABS(n) ((n) > 0 ? (n) : -(n)) #define TEST_ASSERT_ABS_LESS(n, t) \ do { \ if (__ABS(n) >= t) { \ ccprintf("%d: ASSERT_ABS_LESS failed: abs(%d) is " \ "not less than %d\n", __LINE__, n, t); \ task_dump_trace(); \ return EC_ERROR_UNKNOWN; \ } \ } while (0) #define TEST_ASSERT_ARRAY_EQ(s, d, n) \ do { \ int __i; \ for (__i = 0; __i < n; ++__i) \ if ((s)[__i] != (d)[__i]) { \ ccprintf("%d: ASSERT_ARRAY_EQ failed at " \ "index=%d: %d != %d\n", __LINE__, \ __i, (int)(s)[__i], (int)(d)[__i]); \ task_dump_trace(); \ return EC_ERROR_UNKNOWN; \ } \ } while (0) #define TEST_ASSERT_MEMSET(d, c, n) \ do { \ int __i; \ for (__i = 0; __i < n; ++__i) \ if ((d)[__i] != (c)) { \ ccprintf("%d: ASSERT_MEMSET failed at " \ "index=%d: %d != %d\n", __LINE__, \ __i, (int)(d)[__i], (c)); \ task_dump_trace(); \ return EC_ERROR_UNKNOWN; \ } \ } while (0) #define TEST_CHECK(n) \ do { \ if (n) \ return EC_SUCCESS; \ else \ return EC_ERROR_UNKNOWN; \ } while (0) /* Mutlistep test states */ enum test_state_t { TEST_STATE_STEP_1 = 0, TEST_STATE_STEP_2, TEST_STATE_STEP_3, TEST_STATE_STEP_4, TEST_STATE_STEP_5, TEST_STATE_STEP_6, TEST_STATE_STEP_7, TEST_STATE_STEP_8, TEST_STATE_STEP_9, TEST_STATE_PASSED, TEST_STATE_FAILED, }; #define TEST_STATE_MASK(x) (1 << (x)) /* Hooks gcov_flush() for test coverage report generation */ void register_test_end_hook(void); /* * Test initialization. This is called after all _pre_init() calls and before * all _init() calls. */ void test_init(void); /* Test entry point */ void run_test(void); /* Test entry point for fuzzing tests. */ int test_fuzz_one_input(const uint8_t *data, unsigned int size); /* Resets test error count */ void test_reset(void); /* Reports test pass */ void test_pass(void); /* Reports test failure */ void test_fail(void); /* Prints test result, including number of failed tests */ void test_print_result(void); /* Returns the number of failed tests */ int test_get_error_count(void); /* Simulates host command sent from the host */ int test_send_host_command(int command, int version, const void *params, int params_size, void *resp, int resp_size); /* Optionally defined interrupt generator entry point */ void interrupt_generator(void); /* * Trigger an interrupt. This function must only be called by interrupt * generator. */ void task_trigger_test_interrupt(void (*isr)(void)); /* * Special implementation of udelay() for interrupt generator. Calls * to udelay() from interrupt generator are delegated to this function * automatically. */ void interrupt_generator_udelay(unsigned us); #ifdef EMU_BUILD void wait_for_task_started(void); void wait_for_task_started_nosleep(void); #else static inline void wait_for_task_started(void) { } static inline void wait_for_task_started_nosleep(void) { } #endif uint32_t prng(uint32_t seed); uint32_t prng_no_seed(void); /* Number of failed tests */ extern int __test_error_count; /* Simulates UART input */ void uart_inject_char(char *s, int sz); #define UART_INJECT(s) uart_inject_char(s, strlen(s)); /* Simulates chipset power on */ void test_chipset_on(void); /* Simulates chipset power off */ void test_chipset_off(void); /* Start/stop capturing console output */ void test_capture_console(int enabled); /* Get captured console output */ const char *test_get_captured_console(void); /* * Flush emulator status. Must be called before emulator reboots or * exits. */ void emulator_flush(void); /* * Entry point of multi-step test. * * Depending on current test state, this function runs the corresponding * test step. This function should be called in a dedicated task on every * reboot. Also, run_test() is responsible for starting the test by kicking * that task. */ void test_run_multistep(void); /* * A function that runs the test step specified in 'state'. This function * should be defined by all multi-step tests. * * @param state TEST_STATE_MASK(x) indicating the step to run. */ void test_run_step(uint32_t state); /* Get the current test state */ uint32_t test_get_state(void); /* * Multistep test clean up. If a multi-step test has this function defined, * it will be called on test end. (i.e. when test passes or fails.) */ void test_clean_up(void); /* Set the next step and reboot */ void test_reboot_to_next_step(enum test_state_t step); struct test_i2c_read_string_dev { /* I2C string read handler */ int (*routine)(int port, int slave_addr, int offset, uint8_t *data, int len); }; struct test_i2c_xfer { /* I2C xfer handler */ int (*routine)(int port, int slave_addr, const uint8_t *out, int out_size, uint8_t *in, int in_size, int flags); }; struct test_i2c_write_dev { /* I2C write handler */ int (*routine)(int port, int slave_addr, int offset, int data); }; /** * Register an I2C 8-bit read function. * * When this function is called, it should either perform the desired * mock functionality, or return EC_ERROR_INVAL to indicate it does * not respond to the specified port and slave address. * * @param routine Function pointer, with the same prototype as i2c_xfer() */ #define DECLARE_TEST_I2C_XFER(routine) \ const struct test_i2c_xfer __no_sanitize_address \ __test_i2c_xfer_##routine \ __attribute__((section(".rodata.test_i2c.xfer"))) \ = {routine} /* * Detach an I2C device. Once detached, any read/write command regarding the * specified port and slave address returns error. * * @param port The port that the detached device is connected to * @param slave_addr The address of the detached device * @return EC_SUCCESS if detached; EC_ERROR_OVERFLOW if too many devices are * detached. */ int test_detach_i2c(int port, int slave_addr); /* * Re-attach an I2C device. * * @param port The port that the detached device is connected to * @param slave_addr The address of the detached device * @return EC_SUCCESS if re-attached; EC_ERROR_INVAL if the specified device * is not a detached device. */ int test_attach_i2c(int port, int slave_addr); #endif /* __CROS_EC_TEST_UTIL_H */